LEPTOSKOP 2042
الوصف
Product Description
Coating thickness gauge LEPTOSKOP 2042
Depending on the probe, the hand-held device with the clearly arranged display determines the thickness of non-magnetic layers on magnetizable substrates (according to DIN EN ISO 2178) and the thickness of non-conductive layers on non-magnetic, conductive base material using the eddy current principle (according to DIN EN ISO 2360).
External probes are available from a large variety of models, so the most diverse testing problems can be solved.
Key Advantages
- Wide range of calibration options
- Variable display modes for optimal adaptation to the measuring task, depending on the expansion stage
- Limit value input and monitoring
- Measured value storage with easy-to-handle file management as under Windows
- Wide range of statistical evaluation options
- Data transfer to Windows programs optionally with the PC programs iCom or EasyExport
Product Versions
LEPTOSKOP 2042
Device expansion stages
- Module Statistics
- Module Statistics and Data Memory
Standard packages
- Fe Basic Package
- NFe basic package
- Fe/NFE basic package
Statistics packages
- Statistics package Fe
- Statistics package NFe
- Combination Fe/NFe Statistics Package
Data packages
- Data package Fe
- Data package NFe
- Combination data package Fe/NFe
Questions? Ask our specialist team for NDT help or advice
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